Semiconductor Memories | Zookal Textbooks | Zookal Textbooks
  • Author(s) Ashok K. Sharma
  • SubtitleTechnology, Testing, and Reliability
  • Edition1
  • Published26th August 2002
  • PublisherJohn Wiley & Sons Inc (US)
  • ISBN9780780310001

Technology, Testing, and Reliability

Semiconductor Memories provides in-depth coverage in the areas of
design for testing, fault tolerance, failure modes and mechanisms,
and screening and qualification methods including.

* Memory cell structures and fabrication technologies.

* Application-specific memories and architectures.

* Memory design, fault modeling and test algorithms, limitations,
and trade-offs.

* Space environment, radiation hardening process and design
techniques, and radiation testing.

* Memory stacks and multichip modules for gigabyte storage.

Semiconductor Memories

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  • Author(s) Ashok K. Sharma
  • SubtitleTechnology, Testing, and Reliability
  • Edition1
  • Published26th August 2002
  • PublisherJohn Wiley & Sons Inc (US)
  • ISBN9780780310001

Technology, Testing, and Reliability

Semiconductor Memories provides in-depth coverage in the areas of
design for testing, fault tolerance, failure modes and mechanisms,
and screening and qualification methods including.

* Memory cell structures and fabrication technologies.

* Application-specific memories and architectures.

* Memory design, fault modeling and test algorithms, limitations,
and trade-offs.

* Space environment, radiation hardening process and design
techniques, and radiation testing.

* Memory stacks and multichip modules for gigabyte storage.
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